Variable low‐temperature scanning tunneling microscopy study of Si(001): Nature of the 2×1→c(2×4) phase transition

A. R. Smith, F. K. Men, K.‐J. Chao, and C. K. Shih


J. Vac. Sci. Technol. B 14, 914 (1996); doi:10.1116/1.589174 (4 pages)

Copyright (1996) American Vacuum Society. This article may be downloaded for personal use only.
Any other use requires prior permission of the author and the American Vacuum Society.

The following article appeared in A. R. Smith et al., J. Vac. Sci. Technol. B 14, 914 (1996)
and may be found at  https://doi.org/10.1116/1.589174.

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