Scanning tunneling microscopy investigation of the dimer vacancy–dimer vacancy interaction on the Si(001) 2×n surface

A. R. Smith, F. K. Men, K.‐J. Chao, Zhenyu Zhang, and C. K. Shih

J. Vac. Sci. Technol. B 14, 909 (1996); doi:10.1116/1.589173 (5 pages)

Copyright (1996) American Vacuum Society. This article may be downloaded for personal use only.
Any other use requires prior permission of the author and the American Vacuum Society.

The following article appeared in A. R. Smith et al., J. Vac. Sci. Technol. B 14, 909 (1996)
and may be found at https://doi.org/10.1116/1.589173.

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