Identification of first and second layer aluminum atoms in dilute AlGaAs using cross‐sectional scanning tunneling microscopy

Arthur R. Smith, Kuo‐Jen Chao, C. K. Shih, K. A. Anselm, A. Srinivasan, and B. G. Streetman

Appl. Phys. Lett. 69, 1214 (1996); doi:10.1063/1.117415 (3 pages)

Copyright 1996 American Institute of Physics. This article may be downloaded for personal use only.
Any other use requires prior permission of the author and the American Institute of Physics.

The following article appeared in Arthur R. Smith et al., Appl. Phys. Lett. 69, 1214 (1996)
and may be found at https://doi.org/10.1063/1.117415.

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