New variable low‐temperature scanning tunneling microscope for use in ultrahigh vacuum

A. R. Smith and C. K. Shih


Rev. Sci. Instrum. 66, 2499 (1995); doi:10.1063/1.1145647 (5 pages)

Copyright 1995 American Institute of Physics. This article may be downloaded for personal use only.
Any other use requires prior permission of the author and the American Institute of Physics.

The following article appeared in A. R. Smith et al., Rev. Sci. Instrum. 66, 2499 (1995)
and may be found at https://doi.org/10.1063/1.1145647.

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