Cross‐sectional scanning tunneling microscopy study of GaAs/AlAs short period superlattices: The influence of growth interrupt on the interfacial structure

A. R. Smith, Kuo‐Jen Chao, C. K. Shih, Y. C. Shih, and B. G. Streetman


Appl. Phys. Lett. 66, 478 (1995); doi:10.1063/1.114062 (3 pages)

Copyright 1995 American Institute of Physics. This article may be downloaded for personal use only.
Any other use requires prior permission of the author and the American Institute of Physics.

The following article appeared in A. R. Smith et al., Appl. Phys. Lett. 66, 478 (1995)
and may be found at  https://doi.org/10.1063/1.114062.

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